Geometry.Net - Technology: Metrology


Home - Technology - Metrology

e99.com Bookstore

Images

Newsgroups

81-100 of 175 Back | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | Next 20

Metrology: more books (100)

Metrology, Inspection, and Process Control for Microlithography XIV: 28-February-2 March 2000 Santa Clara, California (Proceedings of Spie Volume 3998)
Three-Dimensional Imaging, Optical Metrology, and Inspection V: Proceedings of Spie 19-20 September 1999 Boston, Massachusetts (Proceedings of Spie--the ... Society for Optical Engineering, V. 3835.)
Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology (AIP Conference Proceedings / Materials Physics and Applications) by David G. Seiler, 2007-09-26
Proceedings Of The International Forum On Dimensional Tolerancing And Metrology ( PAPERS PRESENTED IN DEARBORN, MICHIGAN, JUNE 17-19, 1993 )
Gravitational Measurements, Fundamental Metrology and Constants (NATO Science Series C: (closed))
Fringe '97 (Optical Metrology) by Werner Jueptner, 1997
Metrology-based Control for Micro-manufacturing (Proceedings of Spie) by Kenneth W., Jr. Tobin, Fred Lakhani, 2001-06-05
The impact of Israel on Western philosophy (Archives for mosaical metrology and mosaistics) by Ed Metzler, 1993
Metrology, Inspection, And Process Control For Microlithography XVIII (Proceedings of Spie)
Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)
Catalog of federal metrology and calibration capabilities by Kathryn O. Leedy, 1980-01-01
Laser Metrology and Machine Performance IV
Microsystems Engineering: Metrology and Inspection III, 23-25 June 2003 Munich, Germany (Proceedings of Spie)
Advances in Fabrication and Metrology for Optics and Large Optics (Spie Volume 966)

lists with details

Index
Thin Film Optical metrology Software (Ellipsometry, Reflectance, Transmittance) for R D and production. The main product is TFCompanion, a software application for thin film analysis and metrology. Includes analytical tools for interpretation of measurement data. Available for all operating systems with JVM support (Windows, Apple, Unix).
http://www.semiconsoft.com/
P. G. Stein Consultants In Measurement
Offering consulting services as a recognized authority in measurement and measurement science (metrology) for laboratories, business, manufacturing, and calibration.
http://www.measurement.com

Extractions: Set of operations having the object of determining a value of a quantity P. G. Stein Consultants is internationally recognized as an authority in measurement and measurement science (Metrology) for laboratories, business, manufacturing, and calibration Specializing in Consulting in Basic and Advanced Measurement Principles and Practices Education and Training in Measurement, Calibration, Uncertainty ISO/IEC 17025 (Guide 25) Accreditation Assistance Measurements for Business and Service Industries Industrial and manufacturing measurements and Systems Real Time Quality Management Automated measurements and statistical process control systems Measurements in research and development, calibration and testing laboratories. Standards, calibration, traceability, and uncertainty. Quality System Standards ISO 9000 - 2000. QS 9000, TS16949
Multilingual Dictionary On Metrology
Dictionary of basic and general terms in metrology. This is a multilingual dictionary.The model for this dictionary is the International Vocabulary of
http://www.mit.tut.fi/dictionary/

Extractions: in Finnish This is a multilingual dictionary. The model for this dictionary is the International Vocabulary of Basic and General Terms in Metrology, 2. edition, Geneva, published by ISO in names of BIPM - IEC - IFCC - ISO - IUPAC - IUPAP - OIML, 1993 (VIM). The numbering of terms is taken from the Finnish standard SFS3700. It is coherent with the VIM. The sources of the terms are listed on a separate page. If your browser does not support frames, please use individual documents. The base language is English Catalan Chinese Czech ... reference Additional languages for this dictionary are welcome. Please contact professor Aumala and send him (per E-mail) a printable document and a terms file. The terms should be numbered according to VIM and arranged into a table. Please embed fonts into the file if you use other characters than those in Arial or Times New Roman (ISO 8859-1). This WWW service has been created by OlliAumala by permission of Suomen Standardisoimisliitto SFS.
DDS-0101 Calibration Software For 17025, ISO 9000 With 21 CFR Part 11. Home.
Enterpriselevel metrology and calibration data management and tracking software for ISO 17025 ISO 9000 with 21 CFR Part 11.
http://www.dds-inc.com

Extractions: We are the preferred provider of Calibration and Metrology Data Management and Tracking Software for ISO 17025 and ISO 9000 with 21 CFR Part 11! [Use the "ENTER" portal below and to the right to navigate via our friendly and useful Site Map OR Access site sections directly via the links at the bottom of this page.] Diversified Data Systems, Inc. " Years of Trailblazing " Welcome! Thank you for visiting our site. These enterprise systems provide unmatched quality, performance, and scalability. If you're looking for a solution that will remain successful and "state of the art" 15 or 20 years from now, then you should select one of our OpenSystems. Be sure to check out our recently announced OpenMETRIC-LTD "Big Lab Solution for Smaller Labs."
Welcome To TTi
TTi provides short courses for engineers and technicians on vibration and shock, instrumentation, data acquisition, fixturing, and design, also metrology, calibration, electronics and many other topics.
http://www.ttiedu.com
National Institule Of Metrology (Thailand)
Skip Intro TH EN.
http://www.nimt.or.th/
Salzenstein, Patrice
PhD research engineer in time and frequency metrology, featuring phase noise measurements, and the spectral domain for microwave, based in Besan§on, France.
http://www.lpmo.edu/~salzenst/english.html
SIM - Sistema Interamericano De Metrologia
Agreement among national metrology organizations, whose goal is to promoteinternational and regional cooperation in the Americas for scientific,
http://www.sim-metrologia.org.br/
J. H. Metrology
Calibration and repair of electronic and physical/dimensional test equipment.
http://www.jhmetrology.com

Extractions: J.H. Metrology Co., Inc., founded in 1974, is a full service laboratory devoted to excellence in calibration and repair of electronic and physical/dimensional test equipment. We offer on-site calibration (within your facility) to accommodate the customer with large quantities of equipment to calibrate, eliminating downtime or expense of sending the equipment out, and for equipment too large to move.
SSfM-3
Software Support for metrology introduction. The purpose of the SoftwareSupport for metrology (SSfM) programme is to ensure that bestpractice advice
http://www.npl.co.uk/ssfm/

Extractions: The UK's National Measurement Laboratory Advanced Search SS f M Home ... Training Themes Generic Knowledge Transfer Site Map Counting on IT Web Services ... MSC Home Keep informed of SS f M news and events by joining our mailing list: To send feedback on this site please click the link below. Feedback How can we improve the site for you? Email Address Full Feedback Form Contact Us Website Map Science f An increasing number of measurements are obtained using software. The reliability and accuracy of this software, and of the underlying mathematics, are paramount. The purpose of the Software Support for Metrology (SS f M) programme is to ensure that best-practice advice on developing and using metrology software is up to date and made readily available to metrologists, and those who depend on measurements. The main benefit of the programme to the metrology community will be a collection of guides and reports that embody this advice, published in a form that is easy for the metrologist to digest. They will be supported by in-depth technical reports, workshops and training courses. To complement the guides, advice services and helplines, employing a pool of expertise gathered during the previous SS
Electromagnetic Metrology At The National Physical Laboratory: RF & Microwave, D
Contact Details Division of Enabling metrology National Physical LaboratoryHampton Road, Teddington, Middlesex Welcome to Electromagnetic metrology
http://www.npl.co.uk/electrical/
Metrologie Und Akkreditierung Schweiz (metas)
Activities, accreditation, legal aspects, fields of measurement, definitions ofmetric, SI, US and UK units.
http://www.metas.ch/en/
Acculab Calibration
Provides commercial calibration, instrument repair, and compliance metrology. ISO 9000 registered.
http://www.acculabcal.com/
Manufacturing Metrology Division
MMD is fulfilling the measurements and standards needs of the US discretepartsmanufacturers in mechanical metrology and advanced manufacturing technology.
http://www.mel.nist.gov/div822/

Extractions: About MMD What MMD does MMD organization Working with MMD Products and Services Calibration Services Publications Collaboration Opportunities Foreign Guest Researchers Postdoc Researchers Small Business Innovation Research (SBIR) Summer Undergraduate Research Fellowship (SURF) Program Search MMD Webspace Search NIST Webspace Link to FirstGov Website NIST home page MMD Program Areas FY2005 Programs Mechanical Metrology Smart Machining Systems MEL Program Information MEL 2005 Program Book(PDF) MEL Programs at A Glance (PDF) Privacy policy / security notice / accessibility statement Last updated: September 13, 2005 MMD Highlights MEL/MMD Scientist Earns Presidential Award Mechanical engineer Jon R.Pratt (middle) was recognized for his contributions in the fields of fundamental measurement science, manufacturing research, and precision engineering, including realization and dissemination of the unit of force at the micro- and nano-scale.
GSEMI.com - Metrology & Process Semiconductor Equipment, Parts, Refurbishment, A
metrology Process Semiconductor Equipment, Parts, Refurbishment, Repair. Specializing in GaSonics, KLA 213X/255X, AG Associate RTP, PRI/Equipe Robots.
http://www.gsemi.com
Precision Engineering Division
Optical Overlay metrology Research and Standards Development PDF Format.Optical Standards for Integrated Circuit Dimensional metrology PDF Format
http://www.mel.nist.gov/div821/webdocs-14/821-14.htm

Extractions: Nanoscale Metrology Group (821.14) About the Group Nanoscale Metrology Technical Programs Staff Technical Areas Atom-Based Artifacts and Atomic Imaging Tool Development Atomic Displacement Metrology Integrated Dimensional and Electrical Metrology of Nanostructures Length Scale Interferometer Development and Line Scale Measurement Calibration Services ... SEM Linewidth, Magnification and Sharpness Metrology Products and Services Calibrations Standard Reference Materials Publications Research Opportunities Postdoctoral Opportunties in PED NIST/NRC Postdoctoral Research Associateships Gallery NIST TelePresence Microscopy Site Group Leader Dr. Michael T. Postek
Metrology, Research, Special Cutting Tools, Quality, Training Boch
Manufacture of cutting tools in HSS, hard metal and PCD special drills, cutters, reamers, counterborers, taps, integral, carbide tipped and indexable milling cutters and provice standards, measurement and testing; calibration of measuring instruments and development of new products in optical and laser metrology.
http://www.boch.net

Extractions: Technical translation services We are specialized in design of special cutting tools (hard metal and PCD): special drills, cutters, reamers, counterborers, taps, integral, carbide tipped and indexable milling cutters. Our tools are delivered locally and worldwide (Europe, Singapore, South Africa, South America). They increase machining performance in aerospace, defence, automotive and energy (turbine blading) industries. References available. Just fax or e-mail us your drawing or sketch with specifications and we'll offer you our technical assistance, price and delivery. For any info please dial +39.348.4121280. We develop and supply software applications in many areas including statistical process control (SPC), sampling acceptance (MIL STD 105 , 414, 1235), data acquisition in manual or automatic manufacturing processes and FMS, calibration MSA Our consulting services include: Industrial length metrology - laser interferometry . Our R&D dept participates in EU "Standards, Measurement and Testing" research projects on development of new products in optical and laser metrology
Metrology - Home
Install the new metrology Screensaver with calendar function download surveying, mapping, navigation, metrology (industrial measurement),
http://www.leica-geosystems.com/metrology/

Extractions: new COOLjsMenu("Divisions_Worldwide", DIVISION_WORLDWIDE_MENU_ITEMS) Divisions Worldwide Solutions Products ... Contact new COOLjsMenu("NavTop", NAV_TOP_MENU_ITEMS) DE document.write(menuInfo[0]); Latest Product 5-Year Warranty Program Keeping Leica Laser Trackers in top shape has never been easier and more affordable - Confidence in Quality. What our customers say.. F1 Newcomers Take Pole Position in Design Measurement Race more New Leica Screensaver Install the new Metrology Screensaver with calendar function download Leica Geosystems provides solutions and systems for positioning, surveying, mapping, navigation, metrology (industrial measurement), machine guidance, cadastral, building and construction, photogrammetry, mining and engineering, image processing for remote sensing, metrology, and other surveying and measurement applications. Measuring systems include high precision GPS, total stations, theodolites, levels, GIS, software, aerial cameras, hand held measurement devices (DISTOâ¢ distance meters) and 3D laser scanning systems.
WaveFront Sciences Optics & Instrumentation - Semiconductor, Ophthalmic, Instrum
ShackHartmann wavefront sensors, laser metrology, ophthalmic instruments, semiconductor wafer metrology instruments and micro-optics.
http://www.wavefrontsciences.com

Extractions: December 9-11 American Academy of Optometry, Tampa FL WaveFront Sciences Semiconductor The award-winning Columbus unites nanotopography and wafer geometry into a single package, measuring the shape, nanotopography, global and site-specific flatness of 200mm and 300mm silicon wafers while maintaining a high throughput. Columbus
Metrology.corona.navy.mil/
metrology Job Search Results NCSL InternationalDynamic Technology, Inc. metrology Technician, Michigan. Qlt Inc. CalibrationTechnician III, BC. Tra-Cal, Lab Manager/Tech, Maryland
http://metrology.corona.navy.mil/

81-100 of 175 Back | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | Next 20