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         Metrology:     more books (100)
  1. Metrology, Inspection, and Process Control for Microlithography XIV: 28-February-2 March 2000 Santa Clara, California (Proceedings of Spie Volume 3998)
  2. Three-Dimensional Imaging, Optical Metrology, and Inspection V: Proceedings of Spie 19-20 September 1999 Boston, Massachusetts (Proceedings of Spie--the ... Society for Optical Engineering, V. 3835.)
  3. Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology (AIP Conference Proceedings / Materials Physics and Applications) by David G. Seiler, 2007-09-26
  4. Proceedings Of The International Forum On Dimensional Tolerancing And Metrology ( PAPERS PRESENTED IN DEARBORN, MICHIGAN, JUNE 17-19, 1993 )
  5. Gravitational Measurements, Fundamental Metrology and Constants (NATO Science Series C: (closed))
  6. Fringe '97 (Optical Metrology) by Werner Jueptner, 1997
  7. Metrology-based Control for Micro-manufacturing (Proceedings of Spie) by Kenneth W., Jr. Tobin, Fred Lakhani, 2001-06-05
  8. The impact of Israel on Western philosophy (Archives for mosaical metrology and mosaistics) by Ed Metzler, 1993
  9. Metrology, Inspection, And Process Control For Microlithography XVIII (Proceedings of Spie)
  10. Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)
  11. Catalog of federal metrology and calibration capabilities by Kathryn O. Leedy, 1980-01-01
  12. Laser Metrology and Machine Performance IV
  13. Microsystems Engineering: Metrology and Inspection III, 23-25 June 2003 Munich, Germany (Proceedings of Spie)
  14. Advances in Fabrication and Metrology for Optics and Large Optics (Spie Volume 966)

81. Index
Thin Film Optical metrology Software (Ellipsometry, Reflectance, Transmittance) for R D and production. The main product is TFCompanion, a software application for thin film analysis and metrology. Includes analytical tools for interpretation of measurement data. Available for all operating systems with JVM support (Windows, Apple, Unix).
http://www.semiconsoft.com/
window.location.replace("html/welcome.htm"); Redirectring to html/welcome.htm page

82. P. G. Stein Consultants In Measurement
Offering consulting services as a recognized authority in measurement and measurement science (metrology) for laboratories, business, manufacturing, and calibration.
http://www.measurement.com
NEW! CERTIFIED CALIBRATION TECHNICIAN - We Wrote the Book!
ASQ CCT Exam Refresher, Body of Knowledge Courses, much more!
Laboratory Accreditation Assistance page -
ISO/IEC 17025, ANSI/NCSL Z-540-1, Accreditation Body rules, much more!
MEASUREMENT n.
Set of operations having the object of determining a value of a quantity
P. G. Stein Consultants is internationally recognized as an authority in measurement and measurement science (Metrology) for laboratories, business, manufacturing, and calibration Specializing in
  • Consulting in Basic and Advanced Measurement Principles and Practices
  • Education and Training in Measurement, Calibration, Uncertainty
  • ISO/IEC 17025 (Guide 25) Accreditation Assistance
  • Measurements for Business and Service Industries
  • Industrial and manufacturing measurements and Systems
  • Real Time Quality Management
  • Automated measurements and statistical process control systems
  • Measurements in research and development, calibration and testing laboratories.
  • Standards, calibration, traceability, and uncertainty.
  • Quality System Standards ISO 9000 - 2000. QS 9000, TS16949

83. Multilingual Dictionary On Metrology
Dictionary of basic and general terms in metrology. This is a multilingual dictionary.The model for this dictionary is the International Vocabulary of
http://www.mit.tut.fi/dictionary/
Tampere University of Technology
MIT : Laboratory of Measurement and InformationTechnology
in Finnish
Dictionary of basic and general terms in metrology
This is a multilingual dictionary. The model for this dictionary is the International Vocabulary of Basic and General Terms in Metrology, 2. edition, Geneva, published by ISO in names of BIPM - IEC - IFCC - ISO - IUPAC - IUPAP - OIML, 1993 (VIM). The numbering of terms is taken from the Finnish standard SFS3700. It is coherent with the VIM. The sources of the terms are listed on a separate page. If your browser does not support frames, please use individual documents. The base language is English Catalan Chinese Czech ... reference Additional languages for this dictionary are welcome. Please contact professor Aumala and send him (per E-mail) a printable document and a terms file. The terms should be numbered according to VIM and arranged into a table. Please embed fonts into the file if you use other characters than those in Arial or Times New Roman (ISO 8859-1). This WWW service has been created by OlliAumala by permission of Suomen Standardisoimisliitto SFS.

84. DDS-0101 Calibration Software For 17025, ISO 9000 With 21 CFR Part 11. Home.
Enterpriselevel metrology and calibration data management and tracking software for ISO 17025 ISO 9000 with 21 CFR Part 11.
http://www.dds-inc.com
We are the preferred provider of Calibration and Metrology Data Management and Tracking Software for ISO 17025 and ISO 9000 with 21 CFR Part 11! [Use the "ENTER" portal below and to the right to navigate via our friendly and useful Site Map OR Access site sections directly via the links at the bottom of this page.] Diversified Data Systems, Inc. " Years of Trailblazing " Welcome! Thank you for visiting our site.
We are the preeminent Software Manufacturing Boutique providing integrated data management software systems and solutions for equipment management including:
Calibration Data Management ( OpenMETRIC Equipment Management Centers ("Pools") ( OpenEMBARC ), and Property Management ( OpenPROTRAK
These enterprise systems provide unmatched quality, performance, and scalability. If you're looking for a solution that will remain successful and "state of the art" 15 or 20 years from now, then you should select one of our OpenSystems. Be sure to check out our recently announced OpenMETRIC-LTD "Big Lab Solution for Smaller Labs."

85. Welcome To TTi
TTi provides short courses for engineers and technicians on vibration and shock, instrumentation, data acquisition, fixturing, and design, also metrology, calibration, electronics and many other topics.
http://www.ttiedu.com
Welcome to TTi
Explore our course offerings specialist certificate programs , and learn about our unique instructional approach . Our Las Vegas training center has been open since 2003. TTi has been your specialized technical education source since 1962.
Remember, it's not enough to become qualified;
you must remain qualified.
Email Training@ttiedu.com Congratulations to Jay Merithew of Nokia , who was awarded his Dynamic Test Specialist (DTS) Certificate in January, 2005. Technology Training, Inc. contact information Telephone Toll-free 866-TTi-4Edu (866-884-4338)
Search the TTi Site: Search ANY word Search ALL words Search EXACT phrase Help Technology Training, Inc. 050525 BJA

86. National Institule Of Metrology (Thailand)
Skip Intro TH EN.
http://www.nimt.or.th/

TH
EN
TH
EN

87. Salzenstein, Patrice
PhD research engineer in time and frequency metrology, featuring phase noise measurements, and the spectral domain for microwave, based in Besan§on, France.
http://www.lpmo.edu/~salzenst/english.html
Phase noise measurements: Dr Patrice Salzenstein (Research engineer CNRS)
english version

russian version / version russe

spanish version / version espagnole

CURRICULUM VITAE Personal informations Diplomas and Degrees Job experience Publications ... Languages NEW: LPMO becomes the first laboratory of the CNRS to be ISO17025 accredited for its calibration activities in french
FEMTO-ST, LPMO Dpt. UMR CNRS 6174

(e-mail: Click here RESEARCH ACTIVITIES METROLOGY ACTIVITIES Last update : 30 th september 2004

88. SIM - Sistema Interamericano De Metrologia
Agreement among national metrology organizations, whose goal is to promoteinternational and regional cooperation in the Americas for scientific,
http://www.sim-metrologia.org.br/

Who we are

Noramet

Carimet

Camet
...
BID

spanish
version
SOON
NCSLI Conference:

Washington, August 7- August 11, 2005
EUROMET 19th General Assembly EUROMET 19th General Assembly: SIM Report ... 2001 OAS SIM Project Experimental space available to SIM COUNCIL MEMBERS to discuss SIM issues. Council members will need to fill an application form to participate. SOON! Experimental space available to all SIM members to discuss issues related to SIM . SOON!

89. J. H. Metrology
Calibration and repair of electronic and physical/dimensional test equipment.
http://www.jhmetrology.com
A Full Service
Calibration Laboratory
Traceable to N.I.S.T. Typical Types of Equipment Calibrated Request a Calibration Quote Certifications
ISO/IEC 17025
ISO 9002 Map to Facility Current Client Locations Used Test Equipment for Sale Customer Login
1801 Hicks Road, Unit E
Rolling Meadows, IL 60008
TEL: 847.991.0290
FAX: 847.991.0348
staff@jhmetrology.com

Home
Types of Equipment Request a Quote ... News Tell Us Your Calibration Needs Now! Your Message Or Call us Now at ELECTRONIC AND PHYSICAL/DIMENSIONAL CALIBRATION SERVICES J.H. Metrology Co., Inc., founded in 1974, is a full service laboratory devoted to excellence in calibration and repair of electronic and physical/dimensional test equipment. We offer on-site calibration (within your facility) to accommodate the customer with large quantities of equipment to calibrate, eliminating downtime or expense of sending the equipment out, and for equipment too large to move. Our facility is located at Hicks Road just one block north of Euclid Avenue at the interchange of Illinois Route 53 and Euclid Avenue in Rolling Meadows, Illinois (

90. SSfM-3
Software Support for metrology introduction. The purpose of the SoftwareSupport for metrology (SSfM) programme is to ensure that bestpractice advice
http://www.npl.co.uk/ssfm/
The UK's National Measurement Laboratory Advanced Search SS f M Home ... Training Themes Generic Knowledge Transfer Site Map Counting on IT Web Services ... MSC Home Keep informed of SS f M news and events by joining our mailing list: To send feedback on this site please click the link below. Feedback How can we improve the site for you? Email Address Full Feedback Form
Software Support for Metrology Programme
Contact Us Website Map Science f
Introduction
An increasing number of measurements are obtained using software. The reliability and accuracy of this software, and of the underlying mathematics, are paramount. The purpose of the Software Support for Metrology (SS f M) programme is to ensure that best-practice advice on developing and using metrology software is up to date and made readily available to metrologists, and those who depend on measurements. The main benefit of the programme to the metrology community will be a collection of guides and reports that embody this advice, published in a form that is easy for the metrologist to digest. They will be supported by in-depth technical reports, workshops and training courses. To complement the guides, advice services and helplines, employing a pool of expertise gathered during the previous SS

91. Electromagnetic Metrology At The National Physical Laboratory: RF & Microwave, D
Contact Details Division of Enabling metrology National Physical LaboratoryHampton Road, Teddington, Middlesex Welcome to Electromagnetic metrology
http://www.npl.co.uk/electrical/
The UK's National Measurement Laboratory Advanced Search Electromagnetic Metrology News and Events Publications ... Training Technical Areas Direct Current and Low Frequency RF and Microwave Free Field RF and Microwave Guided Wave Ultrafast and Laser Power Contact Details
Division of Enabling Metrology

National Physical Laboratory
Hampton Road,
Teddington,
Middlesex
T: +44 20 8943 6880
F: +44 20 8943 6458
E: electromagnetic@npl.co.uk NPL Home Science E-Store ... NPL Publications How can we improve the site for you? Email Address Full Feedback Form
Welcome to Electromagnetic Metrology
Contact Us Website Map Science
Browse technical information by clicking on the image below.
For information about calibrations, measurement services or training please follow the links in the left hand menu.
If you have a specific enquiry, please e-mail the Electromagnetic Helpline
Events More Events like this...

92. Metrologie Und Akkreditierung Schweiz (metas)
Activities, accreditation, legal aspects, fields of measurement, definitions ofmetric, SI, US and UK units.
http://www.metas.ch/en/

93. Acculab Calibration
Provides commercial calibration, instrument repair, and compliance metrology. ISO 9000 registered.
http://www.acculabcal.com/

94. Manufacturing Metrology Division
MMD is fulfilling the measurements and standards needs of the US discretepartsmanufacturers in mechanical metrology and advanced manufacturing technology.
http://www.mel.nist.gov/div822/
About MMD What MMD does MMD organization Working with MMD Products and Services Calibration Services Publications Collaboration Opportunities Foreign Guest Researchers Postdoc Researchers Small Business Innovation Research (SBIR) Summer Undergraduate Research Fellowship (SURF) Program Search MMD Webspace Search NIST Webspace Link to FirstGov Website NIST home page
MMD Program Areas FY2005 Programs Mechanical Metrology Smart Machining Systems MEL Program Information MEL 2005 Program Book(PDF) MEL Programs at A Glance (PDF) Privacy policy / security notice / accessibility statement
FOIA
NIST is an agency of the U.S. Commerce Department's Technology Administration. Date created: Feb. 24, 2001
Last updated: September 13, 2005 MMD Highlights MEL/MMD Scientist Earns Presidential Award
Mechanical engineer Jon R.Pratt (middle) was recognized for his contributions in the fields of fundamental measurement science, manufacturing research, and precision engineering, including realization and dissemination of the unit of force at the micro- and nano-scale.
Read more
Links Of Interest Cracking the Nanonewton Force Barrier

How do you weigh a dust mite? Or determine the force required to pull a molecule apart? A prototype NIST instrument can reliably measure forces as small as tens of nanonewtons.

95. GSEMI.com - Metrology & Process Semiconductor Equipment, Parts, Refurbishment, A
metrology Process Semiconductor Equipment, Parts, Refurbishment, Repair. Specializing in GaSonics, KLA 213X/255X, AG Associate RTP, PRI/Equipe Robots.
http://www.gsemi.com
Equipment For Sale
Parts for Sale

Services

r emarketing
Repair services Equipment Wanted GaSonics A1000 (Aura 1000) GaSonics L3510 AG Associates RTP
Equipment
I Parts I Services I Contact Us I Home page I Site Map

96. Precision Engineering Division
Optical Overlay metrology Research and Standards Development PDF Format.Optical Standards for Integrated Circuit Dimensional metrology PDF Format
http://www.mel.nist.gov/div821/webdocs-14/821-14.htm
Nanoscale Metrology Group (821.14) About the Group Nanoscale Metrology Technical Programs Staff Technical Areas Atom-Based Artifacts and Atomic Imaging Tool Development Atomic Displacement Metrology Integrated Dimensional and Electrical Metrology of Nanostructures Length Scale Interferometer Development and Line Scale Measurement Calibration Services ... SEM Linewidth, Magnification and Sharpness Metrology Products and Services Calibrations Standard Reference Materials Publications Research Opportunities Postdoctoral Opportunties in PED NIST/NRC Postdoctoral Research Associateships Gallery NIST TelePresence Microscopy Site Group Leader Dr. Michael T. Postek

97. Metrology, Research, Special Cutting Tools, Quality, Training Boch
Manufacture of cutting tools in HSS, hard metal and PCD special drills, cutters, reamers, counterborers, taps, integral, carbide tipped and indexable milling cutters and provice standards, measurement and testing; calibration of measuring instruments and development of new products in optical and laser metrology.
http://www.boch.net
Boch
and measuring systems
dimensional metrology and torque calibration
Software for quality control and calibration
Technical translation services We are specialized in design of special cutting tools (hard metal and PCD): special drills, cutters, reamers, counterborers, taps, integral, carbide tipped and indexable milling cutters. Our tools are delivered locally and worldwide (Europe, Singapore, South Africa, South America). They increase machining performance in aerospace, defence, automotive and energy (turbine blading) industries. References available. Just fax or e-mail us your drawing or sketch with specifications and we'll offer you our technical assistance, price and delivery. For any info please dial +39.348.4121280.
We develop and supply software applications in many areas including statistical process control (SPC), sampling acceptance (MIL STD 105 , 414, 1235), data acquisition in manual or automatic manufacturing processes and FMS, calibration MSA Our consulting services include:
  • Industrial length metrology - laser interferometry . Our R&D dept participates in EU "Standards, Measurement and Testing" research projects on development of new products in optical and laser metrology

98. Metrology - Home
Install the new metrology Screensaver with calendar function download surveying, mapping, navigation, metrology (industrial measurement),
http://www.leica-geosystems.com/metrology/
new COOLjsMenu("Divisions_Worldwide", DIVISION_WORLDWIDE_MENU_ITEMS) Divisions Worldwide Solutions Products ... Contact new COOLjsMenu("NavTop", NAV_TOP_MENU_ITEMS) DE document.write(menuInfo[0]); Latest Product 5-Year Warranty Program Keeping Leica Laser Trackers in top shape has never been easier and more affordable - Confidence in Quality.
more
Special News more Customer Magazine Edition 1/2005 Upcoming Events 27 September 2005
The Engineering Trade Show more
3 October 2005
MSV 2005 - 47th International Engineering Fair more Latest News 15 September 2005
Leica Geosystems Signs Distribution Contract with Partner in Eastern Europe more
What our customers say.. F1 Newcomers Take Pole Position in Design Measurement Race more New Leica Screensaver Install the new Metrology Screensaver with calendar function download Leica Geosystems provides solutions and systems for positioning, surveying, mapping, navigation, metrology (industrial measurement), machine guidance, cadastral, building and construction, photogrammetry, mining and engineering, image processing for remote sensing, metrology, and other surveying and measurement applications. Measuring systems include high precision GPS, total stations, theodolites, levels, GIS, software, aerial cameras, hand held measurement devices (DISTO™ distance meters) and 3D laser scanning systems.

99. WaveFront Sciences Optics & Instrumentation - Semiconductor, Ophthalmic, Instrum
ShackHartmann wavefront sensors, laser metrology, ophthalmic instruments, semiconductor wafer metrology instruments and micro-optics.
http://www.wavefrontsciences.com
www.wavefrontsciences.com
  • October 23-26 American Academy of Ophthalmology, New Orleans LA
    December 9-11 American Academy of Optometry, Tampa FL
WaveFront Sciences Semiconductor The award-winning Columbus unites nanotopography and wafer geometry into a single package, measuring the shape, nanotopography, global and site-specific flatness of 200mm and 300mm silicon wafers while maintaining a high throughput. Columbus
Nanophase
WaveFront Sciences Ophthalmic COAS (Complete Ophthalmic Analysis System) is revolutionizing our understanding of vision by applying the Shack-Hartmann wavefront sensing to the human eye
The ClearWave aberrometer provides superior metrology of contact lenses, measuring over 8,000 points across a lens with a 0.09mm spatial resolution.
The new CrystalWave provides superior metrology for intra ocular lenses.

100. Metrology.corona.navy.mil/
metrology Job Search Results NCSL InternationalDynamic Technology, Inc. metrology Technician, Michigan. Qlt Inc. CalibrationTechnician III, BC. Tra-Cal, Lab Manager/Tech, Maryland
http://metrology.corona.navy.mil/

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